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Nakatani, Takeshi; Agui, Akane; Yoshigoe, Akitaka; Matsushita, Tomohiro*; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*; Tanaka, Hitoshi*
AIP Conference Proceedings 705, p.290 - 293, 2004/00
We have developed a new method to extract only the orbit fluctuation caused by changing magnetic field error of an insertion device (ID). This method consists of two main parts. (i) The orbit fluctuation is measured with modulating the error field of the ID by using the real-time beam position measuring system. (ii) The orbit fluctuation depending on the variation of the error field of the ID is extracted by the filter applying the Wavelet Transform. We call this approach the amplitude modulation method. This analysis technique was applied to measure the orbit fluctuation caused by the error field of APPLE-2 type undulator (ID23) installed in the SPring-8 storage ring. We quantitatively measured two kinds of the orbit fluctuation which are the static term caused by the magnetic field error and the dynamic term caused by the eddy current on the ID23 chamber.
Matsushita, Tomohiro*; Agui, Akane; Yoshigoe, Akitaka; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*; Nakatani, Takeshi; Tanaka, Hitoshi*
AIP Conference Proceedings 705, p.21 - 24, 2004/00
no abstracts in English
Matsushita, Tomohiro*; Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi; Tanaka, Hitoshi*; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*
Hoshako, 15(5), p.303 - 307, 2002/05
no abstracts in English
Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi; Matsushita, Tomohiro*; Saito, Yuji; Mizumaki, Masaichiro*; Yokoya, Akinari; Tanaka, Hitoshi*; Miyahara, Yoshikazu*; Shimada, Taihei; et al.
Hoshako, 14(5), p.339 - 348, 2001/11
no abstracts in English
Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi*; Matsushita, Tomohiro*; Saito, Yuji; Yokoya, Akinari; Tanaka, Hitoshi*; Miyahara, Yoshikazu*; Shimada, Taihei; Takeuchi, Masao*; et al.
Review of Scientific Instruments, 72(8), p.3191 - 3197, 2001/08
Times Cited Count:21 Percentile:71.58(Instruments & Instrumentation)no abstracts in English
Kobayashi, Hideki*; *; Sasaki, Shigemi; Shimada, Taihei; Takao, Masaru*; *;
JAERI-Tech 96-014, 14 Pages, 1996/03
no abstracts in English
Kobayashi, Hideki*; Sasaki, Shigemi; Shimada, Taihei; Takao, Masaru*; Yokoya, Akinari;
JAERI-Tech 96-013, 32 Pages, 1996/03
no abstracts in English
Sasaki, Shigemi; Kobayashi, Hideki*; Takao, Masaru*; ; *
Review of Scientific Instruments, 66(2), p.1953 - 1955, 1995/02
Times Cited Count:12 Percentile:69.04(Instruments & Instrumentation)no abstracts in English
Sasaki, Shigemi
Nuclear Instruments and Methods in Physics Research A, 347, p.83 - 86, 1994/00
Times Cited Count:175 Percentile:99.6(Instruments & Instrumentation)no abstracts in English
Sasaki, Shigemi; Shimada, Taihei; ; *;
Nuclear Instruments and Methods in Physics Research A, 347, p.87 - 91, 1994/00
Times Cited Count:18 Percentile:81.23(Instruments & Instrumentation)no abstracts in English
Kakuno, Kazunori*; Sasaki, Shigemi; Shimada, Taihei;
JAERI-M 93-156, 27 Pages, 1993/08
no abstracts in English
Sasaki, Shigemi; Kakuno, Kazunori*; *; Shimada, Taihei; ;
Nuclear Instruments and Methods in Physics Research A, 331, p.763 - 767, 1993/00
Times Cited Count:96 Percentile:98.63(Instruments & Instrumentation)no abstracts in English
Sasaki, Shigemi; *; *
Japanese Journal of Applied Physics, 31(12B), p.L1794 - L1796, 1992/12
Times Cited Count:73 Percentile:93.57(Physics, Applied)no abstracts in English
Kakuno, Kazunori*; Sasaki, Shigemi
JAERI-M 92-157, 11 Pages, 1992/10
no abstracts in English
Sasaki, Shigemi; *; *
Review of Scientific Instruments, 63(1), p.409 - 412, 1992/01
Times Cited Count:0 Percentile:0.01(Instruments & Instrumentation)no abstracts in English
*; Sasaki, Shigemi
JAERI-M 91-155, 18 Pages, 1991/10
no abstracts in English
Sasaki, Shigemi
MIA (Marubun communication media), 30, p.9 - 12, 1991/00
no abstracts in English
Sasaki, Shigemi*; Miyamoto, Atsushi*; Hosaka, Masahito*; Yamamoto, Naoto*; Kyo, Ayataro*; Kato, Masahiro*; Imazono, Takashi; Koike, Masato
no journal, ,
The phenomenon of higher harmonic radiation from a helical undulator carrying orbital angular momentum (OAM) attracts a great deal of attention because this novel property may be used as a new probe for synchrotron radiation science that would be performed in diffraction limited light source facilities. Although a diffraction limited VUV and X-ray sources do not yet exist, the 750 MeV UVSOR-III is already a diffraction limited light source in the UV region. In this ring, a tandem-aligned double-APPLE undulator system is installed. Using this set-up, we observed spiral interference patterns between two different harmonic radiations with a scanning fiber multi-channel spectrometer and a CCD camera placed at the end of BL1U beamline. By these measurements, various interference patterns such as single, double, and triple spirals were observed which concur with the theoretical prediction for every mode in the right or left circular polarization.